Automated Volt Maintenance System
By configuring up to ten reference modules into a Fluke 7000 Series Nanoscan chassis, users can create "statistical references" in which the outputs are averaged to produce a drift rate predictable to ±0.15 ppm/year; a noise level (0.01 Hz to 10 Hz) of less than 0.015 ppm; and a temperature coefficient (15°C to 35°C) of less than 0.02 ppm/°C. The Nanoscan chassis has an integral digital null detector that performs inter-comparisons between individual reference module outputs and the average output, or between the average output and an external 10 V reference source such as a Josephson Array. When linked to a PC running Fluke 7050-Volt Maintenance Software, all of these measurements can be automated, archived and statistically analyzed. This also allows the drift rate of the average output to be predicted to extremely high confidence levels. Optional scan modules that allow external references to be included in the nanoscan's comparisons can replace individual reference modules.
The system features a transref chassis option accommodating up to four reference modules and generating an average output comparable with other standards. Protected inside its rugged transit case, the transref is suitable for transportation by normal carrier services in an unpowered status. A patented Zener diode conditioning technique ensures the performance of the individual Zener reference modules is altered by no more than 0.2 ppm, even if the module's internal batteries become exhausted and/or the unit is subjected to low temperatures during transit.
Fluke Corporation, 6920 Seaway Blvd., P.O. Box 9090, Everett, WA 98206. Tel: 425-347-6100; Fax: 425-356-5116.